| |
correction(error) to (ppm) |
| global PU free data |
local PU free data |
 |
 |
comment |
 |
 |
comment |
| statistics |
(10) |
(10) |
10 events |
(7) |
(7) |
2x10 events |
| wall stops |
(2) |
- |
|
(2) |
- |
|
| impurities |
2(3) |
- |
c =10 assumed |
2(3) |
- |
c =10 assumed |
| flat accidentals |
(2) |
(2) |
level 10 |
(3) |
(3) |
level 5x10 |
SR |
- |
(2) |
|
- |
(2) |
|
| diffusion |
1(1) |
- |
no vertex cut |
100(5) |
- |
5 cm radial cut |
effect on electronics |
- |
- |
|
- |
- |
|
| two event correlation |
- |
- |
|
(2) |
(2) |
accidental structure |
| total systematic error |
4.2 |
2.8 |
|
7.1 |
4.1 |
|
total error |
10.9 |
10.4 |
|
10. |
8.1 |
|
|