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Statistical and systematical errors

The estimated statistical, systematic and total errors for the proposed \( \mu ^{-} \)and \( \mu ^{+} \) lifetime measurements are summarized in table 11. The error in \( \Lambda _{s}=\lambda _{\mu^-}-\lambda _{\mu^+} \) is then \( \approx \sqrt{2} \) \( \delta \lambda \approx 14 \) ppm of \( \lambda _{\mu^+} \) or 1% of \( \Lambda _{s} \).


Table 11: Summary of statistical and systematical errors for 2 complementary analysis methods
  correction(error) to \( \lambda \)(ppm)
global PU free data local PU free data
\( \mu ^{-} \) \( \mu ^{+} \) comment \( \mu ^{-} \) \( \mu ^{+} \) comment
statistics (10) (10) 10\( ^{10} \)events (7) (7) 2x10\( ^{10} \)events
wall stops (2) -   (2) -  
impurities 2(3) - c\( _{Z} \)=10\( ^{-8} \)assumed 2(3) - c\( _{Z} \)=10\( ^{-8} \)assumed
flat accidentals (2) (2) level 10\( ^{-4} \) (3) (3) level 5x10\( ^{-4} \)
\( \mu \)SR - (2)   - (2)  
diffusion 1(1) - no vertex cut 100(5) - 5 cm radial cut
\( \mu \) effect on electronics - -   - -  
two event correlation - -   (2) (2) accidental structure
total systematic error 4.2 2.8 7.1 4.1
\( \delta \lambda \) total error 10.9 10.4 10. 8.1  



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Peter Kammel 2001-02-04